AE 523

fall 2011
 
All Classes
Nanoscale Contact Mechanics

Credit: 4 hours.

Short- and long-range dipole and electronic interactions; particle- and surface-force interactions; contact mechanics of rigid and nonrigid media; continuum adhesion models; principles of Atomic Force Microscopy (AFM); artifacts and remedies in AFM imaging; force and scale calibration; dynamics of AC-AFM imaging; force spectroscopy; instrumented nanoindentation. Prerequisite: TAM 451 or TAM 551.

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