AE 523
fall 2009
All Classes
Nanoscale Contact Mechanics
Credit: 4 hours.
Short- and long-range dipole and electronic interactions; particle- and surface-force interactions; contact mechanics of rigid and nonrigid media, continuum adhesion models; principles of Atomic Force Microscopy (AFM), artifacts and remedies in AFM imaging; force and scale calibration; dynamics of AC-AFM imaging; force spectroscopy, instrumented nanoindentation. Prerequisite: TAM 451 or TAM 551.
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