ECE 543
Spring 2006 All Classes
All Classes
Credit: 4 hours.
Fundamental techniques of detecting failures in complex digital systems, algorithms for automatic test generation, and schemes for designing systems to be easily testable and with self test capability; hands-on experience with state-of-the-art computer-aided test tools in the laboratory.
Section Status updates every 10 minutes.
| CRN | Type | Section | Time | Day | Location | Instructor | Section Details | |
|---|---|---|---|---|---|---|---|---|
|
33993
|
Discussion/
Recitation |
C
|
10:00AM
-11:20AM
|
MW
|
57 Everitt Laboratory
|
Patel, J
|
|