AE 523
Fall 2020 All Classes
All Classes
Credit: 4 hours.
Short- and long-range dipole and electronic interactions; particle- and surface-force interactions; contact mechanics of rigid and nonrigid media; continuum adhesion models; principles of Atomic Force Microscopy (AFM); artifacts and remedies in AFM imaging; force and scale calibration; dynamics of AC-AFM imaging; force spectroscopy; instrumented nanoindentation.
Section Status updates every 10 minutes.
| CRN | Type | Section | Time | Day | Location | Instructor | Section Details | |
|---|---|---|---|---|---|---|---|---|
|
54708
|
Online
|
A
|
3:00PM
-4:50PM
|
TR
|
n.a.
|
Chasiotis, I
|
|