ECE 585
Spring 2012 All Classes
All Classes
Credit: 4 hours.
Techniques for characterizing gate oxide and interface properties and reliability, I-V models for circuit simulation, design for control of short channel effects, silicon-on-insulator, and new device structures.
Prerequisite: ECE 441.
Section Status updates every 10 minutes.
| CRN | Type | Section | Time | Day | Location | Instructor | Section Details | |
|---|---|---|---|---|---|---|---|---|
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34009
|
Lecture
|
D
|
12:30PM
-1:50PM
|
TR
|
57 Everitt Laboratory
|
Rosenbaum, E
|
|