AE 523
Nanoscale Contact Mechanics
Credit: 4 hours.
Short- and long-range dipole and electronic interactions; particle- and surface-force interactions; contact mechanics of rigid and nonrigid media, continuum adhesion models; principles of Atomic Force Microscopy (AFM), artifacts and remedies in AFM imaging; force and scale calibration; dynamics of AC-AFM imaging; force spectroscopy, instrumented nanoindentation. Prerequisite: TAM 451 or TAM 551.
Available fall 2009